Search Results - Mohd Jeffery Manaf,

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    Characterization of alignment strategy to achieve a reliable alignment accuracy in advanced lithography

    Characterization of alignment strategy to achieve a reliable alignment accuracy in advanced lithography by Normah Ahmad, Uda Hashim, Mohd Jeffery Manaf, Kadir Ibrahim Abdul Wahab

    Published 2007
    Get full text
    Get full text
    Get full text
    Article
    Save to List
    Saved in:
  2. 2
    Effect of alignment mark architecture on alignment signal behavior in advanced lithography

    Effect of alignment mark architecture on alignment signal behavior in advanced lithography by Normah, Ahmad, Uda, Hashim, Mohd Jeffery, Manaf, Kader Ibrahim, Abdul Wahab

    Published 2009
    Get full text
    Article
    Save to List
    Saved in:

Search Tools: