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    Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback

    Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback by Kou, Lili, Ma, Zongmin, Li, Yan Jun, Naitoh, Yoshitaka, Komiyama, Masaharu, Sugawara, Yasuhiro

    Published 2015
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