Search Results - Algethami M.

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    Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications

    Investigation of Morphological, Optical, and Dielectric Properties of RF Sputtered WOx Thin Films for Optoelectronic Applications by Mahjabin S., Haque M.M., Sobayel K., Selvanathan V., Jamal M.S., Bashar M.S., Sultana M., Hossain M.I., Shahiduzzaman M., Algethami M., Alharthi S.S., Amin N., Sopian K., Akhtaruzzaman M.

    Published 2023
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